Functional Device Engineering Laboratory / Kyushu University

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D-bldg.IGSES. the second-floor 205.

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Evaluation and Analysis Systems

DLTS (Deep Level Transient Spectroscopy)

Impedance Analyzer

Atomic Force Microscope (AFM)

Hall effect measurement system
Semiconductor Electronic Measurement Systems

Thin film thickness measurement system
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LANGUAGE

  • Japanese
  • English
  • OI Bldg.
  • cleanroom 1
  • the second-floor 204.
  • D-bldg. IGSES. the second-floor 205.
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